응용

광회절 측정에 있어서 Mie theory 의 적용은 아래의 범주내의 구형입자에 적합하다.:

불투명 입자	2 micron이하가 90%인 경우에 적용.
투명 입자	200 micron이하가 90%인 경우에 적용.

Mie 이론의 적용시 비구형입자, 혼합성분에는 적합하지 않고, 반드시 입자의 굴절율을 알아야 한다.

기술사양

sensors:	HELOS family	MYTOS family
measuring ranges:	all measuring ranges	all particle sizes
range of relative complex refractive index	refraction coefficient 0.1 <= n <= 5.0	absorption coefficient 0.0; 1E-5<= k <= 8.0
evaluation:	MIEE	Mie Extended Evaluation Mode

Background Information

The basis for applying the Mie theory is the publication by G. Mie[2] in 1908, in which an exact solution of Maxwell's equations was formulated for scattering of electromagnetic waves by spherical particles. This solution is known as the Mie theory. A detailed description is presented in [3].

For the application of Mie theory, the complex refractive index, n of the particles and the refractive index n_m of the (non-absorbing) fluid must be known.

The complex refractive indes ist defined by:	n = np - i * kp
The relative complex refractive index is defined by:	m =n/nm
where
np	the refractive index of the particle, describes reflection and refraction,
nm	the refractive index of the fluid,
kp	the absorption coefficien of the particle, describes the absorption,
i	the imaginary unity.