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| Time | Event |
| 8:30 | Start of Registration The registration desk in the entrance hall of CNN East opens at 8:30 am Mrs. Simone Koch, Secretariat, info@nanoparticle-metrology.de |
| 9:15 | Welcome G. Roebben, M. Stintz, T. Burke, W. Witt |
Session A – Fundamentals of ENP characterisation |
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| 09:30 | General aspects of particle sizing M. Stintz (Technical University Dresden, DE) |
| 10:00 | Terminology and standards for ENP characterisation T. Thornton (Micromeritics, USA) |
| 10:30 | Metrology for particle sizing G. Roebben (JRC-IRMM, EU) |
| 11:00 | Coffee break |
Session B – Objectives of ENP characterisation |
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| 11:30 | Quality assurance and process control B. Sachweh (BASF, DE) |
| 12:00 | ENP characterization in view of health studies – the NANO-CARE project T. Kuhlbusch (IUTA, DE) |
| 12:30 | ENP sizing and concentration measurement for environmental risk assessment M. Hassellöv (University Gothenburg, SE) |
| 13:00 | Lunch break |
Session C1 – ENPs in liquid media: sizing |
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| 14:30 | Comparing methods for measurements in liquid P. Bowen (EPFL, CH) |
| 15:00 | Characterisation of NPs with DLS A. Rawle (Malvern, USA) |
| 15:30 | Sizing with on-line methods W. Witt (Sympatec, DE) |
| 16:00 | Coffee break |
Session C2 – ENPs in liquid media: interfacial properties |
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| 16:15 | Measuring interfacial properties using electroacoustics A. Dukhin (Dispersion Technology, USA) |
| 16:45 | Zeta-potential measurement R. Xu (Beckman Coulter, USA) |
| 17:15 | Suspension stability D. Lerche (L.U.M., DE) |
| 17:45 | End of Part 1 |
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Dinner at the "Heilig-Geist-Spittal" in Nuremberg Spitalgasse 16 90403 Nürnberg Tel. : 0911 221761 |
| Time | Event |
| 8:30 | Start of Registration Mrs. Simone Koch, Secretariat, info@nanoparticle-metrology.de |
Session D – Characterisation of airborne particles |
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| 09:00 | Survey on aerosol measurement techniques G. Sem (TSI, USA) |
| 09:30 | Exposure assessment in settings relevant to nanotechnologies R. Aitken (IOM, UK) |
| 10:00 | Coffee break |
Session E – Reference materials |
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| 10:30 | Reference materials: concepts, applications and examples A. Lamberty (JRC-IRMM, EU) |
| 11:00 | Experiences with ENP reference materials V. Hackley (NIST, USA) |
| 11:30 | Preparation of sub-micrometer particles for reference materials Y. Mori (Doshisha Uni, JP) |
| 12:00 | Lunch break |
Session F – Sizing and material characterisation |
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| 13:30 | Size determination of NPs with SAXS M. Krumrey (PTB, DE) |
Session G – Concluding discussion |
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| 14:00 | - What exactly can be measured today? |
| 15:30 | Closing of the workshop |
* lecturer(s); the times are including 5 minutes for discussion
(changes of the program are reserved, the room is labeled)
Lecture titles / speakers / authors / affiliations are listed as indicated by the speaker.
Workshop |
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|
|
| Program | |
| Registration | |
|
|
Information |
|
| Press | |
| Registration for Downloads |
|
| Downloads | |
Please download the program as pdf-file (818 kB) here .
Secretariat
Mrs. Simone Koch
Sympatec GmbH
System-Partikel-Technik
Am Pulverhaus 1
38678 Clausthal-Zellerfeld
Phone: +49 (5323) 717 410
Fax: +49 (5323) 717 419
info@nanoparticle-metrology.de
Co-Nanomet
Dr. Theresa Burke
euspen
www.co-nanomet.eu
Congress Center Nuremberg CNN Ost
(in direct neighbourhood of POWTECH Hall 7),
Level 3, Room "Shanghai",
Messezentrum
90471 Nürnberg
Germany
Please download the area map of the Nuremberg Messe and the building (as download of a pdf-file 727kB).
Please use GoogleMapsTM for a map of Nuremberg or the calculation of the roote to the workshop location:
