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| Topic | Date | File |
| Hand-out Co-nanomet, including final lst of participants and feedback results | 06 May 2010 | pdf 1.7MB |
| Topic | Date | File |
| General aspects of particle sizing M. Stintz (Technical University Dresden, DE) |
15 May 2010 | pdf 91kB |
| Terminology and standards for ENP characterisation T. Thornton (Micromeritics, USA) |
15 May 2010 | pdf 77kB |
| Metrology for particle sizing G. Roebben (JRC-IRMM, EU) |
11 May 2010 | pdf 3.99MB |
| Quality assurance and process control B. Sachweh (BASF, DE) |
01 Sep 2010 | pdf_2.74MB |
| ENP characterization in view of health studies – the NANO-CARE project T. Kuhlbusch (IUTA, DE) |
01 Sep 2010 | pdf_12MB |
| ENP sizing and concentration measurement for environmental risk assessment M. Hassellöv (University Gothenburg, SE) |
31 May 2010 | pdf_2.15MB |
| Comparing methods for measurements in liquid P. Bowen (EPFL, CH) |
21 May 2010 | pdf_2.87MB |
| Characterisation of NPs with DLS A. Rawle (Malvern, USA) |
15 May 2010 | pdf 2.46MB |
| Sizing with on-line methods W. Witt (Sympatec, DE) |
28 May 2010 | pdf_1.72MB |
| Measuring interfacial properties using electroacoustics A. Dukhin (Dispersion Technology, USA) |
31 May 2010 | pdf_881kB |
| Zeta-potential measurement R. Xu (Beckman Coulter, USA) |
15 May 2010 | pdf_ 207kB |
| Suspension stability D. Lerche (L.U.M., DE) |
20 October 2010 | pdf_1.16MB |
| Survey on aerosol measurement techniques G. Sem (TSI, USA) |
31 May 2010 | pdf_1.52MB |
| Exposure assessment in settings relevant to nanotechnologies R. Aitken (IOM, UK) |
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| Reference materials: concepts, applications and examples A. Lamberty (JRC-IRMM, EU) |
31 May 2010 | pdf_286kB |
| Experiences with ENP reference materials V. Hackley (NIST, USA) |
15 May 2010 | pdf 2.15MB |
| Preparation of sub-micrometer particles for reference materials Y. Mori (Doshisha Uni, JP) |
21 May 2010 | pdf_2.12MB |
| Size determination of NPs with SAXS M. Krumrey (PTB, DE) |
15 May 2010 | pdf 3.46MB |
| Topic | Date | File |
| Peculiarities of living cells interactio with micro- and nanoparticles A. Dukhin (Dispersion Technology, USA) |
15 May 2010 | pdf 1.36MB |
| Regional and International Interlaboratory Comparisons A.K. Jamting (National Measurement Institute, Australia) |
15 May 2010 | pdf 2.62MB |
| Nanotechnology standardisation - A survey M. Schmitt ( DIN Deutsches Institut für Normung e.V., Germany) |
15 May 2010 | pdf 400kB |
| Qualification of nanoparticles releases M. Stintz (Technical University Dresden, DE) |
15 May 2010 | pdf 156kB |
| Nanopowder Synthesis and Metrology P. Bowen (EPFL, CH) |
21 May 2010 | pdf_323kB |
| Transmission Scanning Electron Microscopy (TSEM): A New Means for Characterization of Nanoparticles T. Klein, C. G. Frase, K. P. Johnsen and E. Buhr (PTB, DE) |
21 May 2010 | pdf_886kB |
Workshop |
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| Program | |
| Registration | |
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Information |
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| Press | |
| Registration for Downloads |
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| Downloads | |
Please download the program as pdf-file (818 kB) here .
Secretariat
Mrs. Simone Koch
Sympatec GmbH
System-Partikel-Technik
Am Pulverhaus 1
38678 Clausthal-Zellerfeld
Phone: +49 (5323) 717 410
Fax: +49 (5323) 717 419
info@nanoparticle-metrology.de
Co-Nanomet
Dr. Theresa Burke
euspen
www.co-nanomet.eu
Congress Center Nuremberg CNN Ost
(in direct neighbourhood of POWTECH Hall 7),
Level 3, Room "Shanghai",
Messezentrum
90471 Nürnberg
Germany
Please download the area map of the Nuremberg Messe and the building (as download of a pdf-file 727kB).
Please use GoogleMapsTM for a map of Nuremberg or the calculation of the roote to the workshop location:
