The application of the Mie theory for the evaluation of laser diffraction measurements is appropriate for spherical particles of pure materials with the following properties:
|
opaque particles |
expected size distribution: 90% below 2?m |
| transparent particles | expected size distribution: 90% below 200?m |
The application of Mie theory is not suited for non-spherical particles, for mixtures of various materials, and for particles with unknown refractive index.
|
sensors: |
Laser Diffraction Sensors | HELOS or MYTOS |
| measuring ranges: | R1 to R4 | particle size < 350?m |
| range of complex refractive index n - i*k: | refraction coefficient 0.01 <= n <= 3.0 |
absorption coefficient 0.0 <= k <= 5.0 |
| evaluation: | HRLD evaluation mode | high resolution, high speed |
The basis for applying the Mie theory is the publication by G. Mie[2] in 1908, in which an exact solution of Maxwell's equations was formulated for scattering of electromagnetic waves by spherical particles. This solution is known as the Mie theory. A detailed description is presented in [3].
For the application of Mie theory, the complex index of refraction, m, must be known. It is defined as
m = n - i * k
where
n the refractive index, describes reflection and refraction, and
k the absorption coefficient, describes the absorption
i the unit of the imaginary fraction of m.