Excellent Traceability with Lattice Fence Distributions

Sympatec GmbH has proposed a new type of standard reference material (SRM) for primary validation of laser diffraction and image analysis instruments.

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A lattice fence distribution covering one decade in particle size composed from 7 (log.) equally spaced spherical monodisperse materials.

For the first time this SRM uses a lattice fence distribution composed from a mixture of precisely qualified spherical, monodisperse materials. It enables much better precision in size and quantity than before independent of the width of the distribution.

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News Validated Mie Evaluation covers Particle Sizes from 1 nm to 10 mm

100 years after the introduction of the fundamental light scattering theory by Gustav Mie, a German physicist, Sympatec GmbH has introduced a new Mie code for its laser diffraction (LD) and photon cross correlation (PCCS) instruments. For the first time this code covers a size range from below 1nm up to 10mm and has been validated with a new extreme precision analysis by applying more than 40.000 precisely calculated data sets for verification.

This code is available for the WINDOX software versions 5.4.1 for PCCS and 5.4.2 for LD, or higher.

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Non-spherical Reference Materials Traceable to the Standard Metre?

Sympatec GmbH has recently published an investigation on non-spherical reference materials comparing the results of laser diffraction and dynamic image analysis. An excellent agreement is obtained even for non-spherical material, if both methods are using the same disperser. The image data of QICPIC have been converted to an equivalent laser diffraction signal by 2D Fourier transformations. Both systems have been set-up using first principles without using a particle size standard for calibration.

This method could be used in the near future to migrate image analysis results to laser diffraction results even for non-spherical particles at high precision.

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Spectacular NANOPHOX Development!

Sympatec GmbH has released a major re-design of its unique Dynamic Light Scattering based NANOPHOX PCCS instrument.

The Sympatec specific NNLS evaluation algorithm, allowing for secure determination of size distributions even with multimodal structures has now been enhanced with the “auto-NNLS” mode. The outstanding performance provides very reliable and realistic information about the particle size distributions, which are at the same time highly reproducible. The auto-NNLS mode requires no operator input for optimum determination of evaluation parameters and thus is applicable in validated environments and for FDA conform SOP’s as well. However, for special tasks manual operation and optimisation if requested is still available.

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Poster publication of Pfizer on AAPS 2007.

During the recent annual 2007 meeting of the American Association of Pharmaceutical Scientists in San Diego (11 to 15 November) Glenn Carlson & Bruno Hancock of Pfizer Inc., Groton CT, USA, presented a very informative poster regarding "The Effect of lot-to-lot Particle Size Variation in AVICELL?  PH Grades of Microcrystalline Cellulose (MCC) on Bulk Powder and Compact Properties".

The particle size distribution was analysed using the Sympatec HELOS laser diffraction (LD) instrument and the RODOS dry powder disperser. These (LD) results were then complemented with a shape distribution analysis performed on the Sympatec QICPIC dynamic image analysis instrument using the RODOS dry powder disperser.

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Sympatec wins Nano Award

The 1st prize of the photo competition "Nano im Bild" was awarded to Sympatec with its collage Nanu? Nano!.

The prize was awarded on 7 November 2007 during the Nano Workshop 2007 in the auditorium of the Technical University of Clausthal-Zellerfeld, Germany.

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Symbol: Sympatec Cactus

Exhibitions & Events in 2008

flag_de PSA Tour Chicago,
20 October 2008, Chicago, Illinois, US

flag_de QICPIC User Meeting
Chicago,

21 October 2008, Chicago, Illinois, US

flag_de PSA Tour Toledo,
23 October 2008, Toledo, Ohio, US

flag_de Expoquimia 2008
20 - 24 October 2008, Barcelona, Spain

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